Delta- <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mi>T</mml:mi></mml:math> noise in the Kondo regime

We study the delta-T noise in Kondo regime, which implies charge current under temperature bias for SU(2) quantum dot. propose an experimentally measurable quantity to quantify low-temperature properties noise: $S_{\ell}=S(T_{\mathrm{L}},T_{\mathrm{R}}) - (1/2)[S(T_{\mathrm{L}},T_{\mathrm{L}}) + S(T_{\mathrm{R}},T_{\mathrm{R}})]$, yields shot expression noninteracting limit. calculate this dot particle-hole symmetric case. found that $S_{\ell}$ exhibits qualitatively same behavior both electrochemical potential biased case and The quantitative difference appears as a of coefficients noises, reflects Fermi distribution function: or biased.